Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
10 articles.
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2. An Amalgamated Testability Measure Derived from Machine Intelligence;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
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5. Robust Deep Learning for IC Test Problems;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-01