Current issues and emerging techniques for VLSI testing - A review☆-Reference-Cited by-同舟云学术

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Current issues and emerging techniques for VLSI testing - A review☆

Published:2022-12 Issue: Volume:24 Page:100497
ISSN:2665-9174
Container-title:Measurement: Sensors
language:en
Short-container-title:Measurement: Sensors

Author:

Thakur Garima,Jain Shruti,Sohal Harsh

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference56 articles.

1. Digital Systems Testing and Testable Design;Abramovici,2002

2. Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits;Bushnell,2005

3. VLSI Test Principles and Architectures: Design for Testability;Wang,2006

4. Yield Ramp Challenges Increase;Mutschler,2014

5. Finding Defects in Chips with Machine Learning;Lapedus,2019

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Applications of AI/ML Algorithms in VLSI Design and Technology;Integrated Devices for Artificial Intelligence and VLSI;2024-07-31

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