Machine Learning and Its Applications in Test
Author:
Publisher
Springer International Publishing
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-19639-3_3
Reference22 articles.
1. Cho, K., van Merrienboer, B., Gulcehre, C., Bahdanau, D., Bougares, F., Schwenk, H., Bengio, Y.: Learning Phrase Representations using RNN Encoder-Decoder for Statistical Machine Translation. arXiv:1406.1078 (2014)
2. Schuster, M., Paliwal, K.K.: Bidirectional recurrent neural networks. IEEE Trans. Signal Process. 45(11), 2673–2681 (1997)
3. Li, Z., et al.: Test-Cost Optimization in a Scan-Compression Architecture Using Support-Vector Regression. In: VLSI Test Symposium (VTS) (2017)
4. Zorian, A., et al.: Machine Learning-Based DFT Recommendation System for ATPG QOR. In: International Test Conference (ITC) (2019)
5. Wu, C.-H., et al.: Deep Learning Based Test Compression Analyzer. In: Asian Test Symposium (ATS) (2019)
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