Deep Learning Based Test Compression Analyzer

Author:

Wu Cheng-Hung,Huang Yu,Lee Kuen-Jong,Cheng Wu-Tung,Veda Gaurav,Reddy Sudhakar,Hu Chun-Cheng,Ye Chong-Siao

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06

2. A Review of Intelligent Design for Test Based on Machine Learning;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08

3. Machine Learning and Its Applications in Test;Machine Learning Support for Fault Diagnosis of System-on-Chip;2023

4. An optimized DFT technology based on machine learning;2021 IEEE International Test Conference in Asia (ITC-Asia);2021-08-18

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