An optimized DFT technology based on machine learning
Author:
Affiliation:
1. Nanjing University of Posts and Telecommunications, #9, Wenyuan Road,College of Electronic and Optical Engineering,Nanjing City,People’s Republic of China,210003
Funder
National Natural Science Foundation of China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9808359/9808467/09808628.pdf?arnumber=9808628
Reference10 articles.
1. Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels
2. Deep Learning Based Test Compression Analyzer
3. Methods and systems for circuit fault diagnosis;goel,2015
4. Survey of Test Vector Compression Techniques
5. Designing efficient combinational compression architecture for testing industrial circuits
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