Robust Deep Learning for IC Test Problems

Author:

Chowdhury Animesh BasakORCID,Tan BenjaminORCID,Garg SiddharthORCID,Karri RameshORCID

Funder

NSF

Office of Naval Research

NSF Career Award

New York University/New York University Abu Dhabi CCS

Office of Naval Research Award

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. RTL Simulation Acceleration with Machine Learning Models;2024 25th International Symposium on Quality Electronic Design (ISQED);2024-04-03

2. HybMT: Hybrid Meta-Predictor based ML Algorithm for Fast Test Vector Generation;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22

3. AI/ML algorithms and applications in VLSI design and technology;Integration;2023-11

4. Data-Driven Reliability Models of Quantum Circuit: From Traditional ML to Graph Neural Network;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-05

5. Smart Model For Career Guidance Using Hybrid Deep Learning Technique;2023 1st International Conference on Innovations in High Speed Communication and Signal Processing (IHCSP);2023-03-04

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