Data-Driven Reliability Models of Quantum Circuit: From Traditional ML to Graph Neural Network-Reference-Cited by-同舟云学术

Data-Driven Reliability Models of Quantum Circuit: From Traditional ML to Graph Neural Network

Published:2023-05 Issue:5 Volume:42 Page:1477-1489
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Saravanan Vedika¹^ORCID,Saeed Samah M.²^ORCID

Affiliation:

1. Department of Electrical Engineering, The City College of New York, The City University of New York, New York, NY, USA

2. Department of Electrical Engineering, The City College of New York, New York, NY, USA

Funder

PSC-CUNY Award, jointly funded by the Professional Staff Congress and the City University of New York

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

Reference80 articles.

1. Error mitigation in quantum computers through instruction scheduling;smith;aXiv 2105 01760,2021

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2. Quantum Neural Networks and Their Potential in Traffic Prediction;2023 Intelligent Technologies and Electronic Devices in Vehicle and Road Transport Complex (TIRVED);2023-11-15

5. Quantum KNN Classification With K Value Selection and Neighbor Selection;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023