Data-Driven Reliability Models of Quantum Circuit: From Traditional ML to Graph Neural Network
Author:
Affiliation:
1. Department of Electrical Engineering, The City College of New York, The City University of New York, New York, NY, USA
2. Department of Electrical Engineering, The City College of New York, New York, NY, USA
Funder
PSC-CUNY Award, jointly funded by the Professional Staff Congress and the City University of New York
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Link
http://xplorestaging.ieee.org/ielx7/43/10106059/09877896.pdf?arnumber=9877896
Reference80 articles.
1. Error mitigation in quantum computers through instruction scheduling;smith;aXiv 2105 01760,2021
2. Knowledge Graph Embedding via Graph Attenuated Attention Networks
3. Improving Reliability of Quantum True Random Number Generator using Machine Learning
4. Forecasting Transactional Amount in Bitcoin Network Using Temporal GNN Approach
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