Author:
Lin Yen-Tzu,Blanton R. D. Shawn
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
8 articles.
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1. Faulty Function Extraction for Defective Circuits;2024 IEEE European Test Symposium (ETS);2024-05-20
2. PEPR: Pseudo-Exhaustive Physically-Aware Region Testing;2022 IEEE International Test Conference (ITC);2022-09
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4. Towards Smarter Diagnosis;ACM Transactions on Design Automation of Electronic Systems;2020-10-02
5. PADLOC: Physically-Aware Defect Localization and Characterization;2017 IEEE 26th Asian Test Symposium (ATS);2017-11