PEPR: Pseudo-Exhaustive Physically-Aware Region Testing
Author:
Affiliation:
1. Carnegie Mellon University,Electrical and Computer Engineering Department,Pittsburgh,Pennsylvania
2. Stanford University,Department of Electrical Engineering and Department of Computer Science,Stanford,California
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9983856/9983857/09983894.pdf?arnumber=9983894
Reference30 articles.
1. Gate Exhaustive Testing;cho;IEEE International Test Conference,2005
2. Deriving Accurate Fault Models;acken;Stanford University 1988 copyright - Database copyright ProQuest LLC ProQuest does not claim copyright in the individual underlying works Last updated - 2022–02-26,0
3. Generating pseudo-exhaustive vectors for external testing
4. The Region-Exhaustive Fault Model
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