Author:
Hellebrand S.,Wunderlich H.-J.,Haberl O.F.
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. PEPR: Pseudo-Exhaustive Physically-Aware Region Testing;2022 IEEE International Test Conference (ITC);2022-09
2. Application of deterministic logic BIST on industrial circuits;Journal of Electronic Testing;2001
3. Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2000-12
4. Deterministic BIST with multiple scan chains;Journal of Electronic Testing;1999
5. Bounds on pseudoexhaustive test lengths;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;1998-09