Author:
Jas Abhijit,Natarajan Suriyaprakash,Patil Srinivas
Cited by
15 articles.
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1. Bit-Complemented Test Data to Replace the Tail of a Fault Coverage Curve;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-04
2. A Block Partitioning Method for Region Exhaustive Test to Reduce the Number of Test Patterns and Improve Gate Exhaustive Fault Coverage;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
3. Wrapping Paths of Undetected Transition Faults With Two-Cycle Gate-Exhaustive Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12
4. PEPR: Pseudo-Exhaustive Physically-Aware Region Testing;2022 IEEE International Test Conference (ITC);2022-09
5. Increasing the Fault Coverage of a Truncated Test Set;ACM Transactions on Design Automation of Electronic Systems;2022-06-27