Ultra-low-voltage operation: Device perspective
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5981422/5993591/05993605.pdf?arnumber=5993605
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Method to Neutralize the Impact of DVS on the Reliability of COTS SRAMs With ECC by Using Periodic Scrubbing;IEEE Transactions on Nuclear Science;2023-12
2. Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation;IEEE Transactions on Nuclear Science;2022-02
3. Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs;2021 IEEE 22nd Latin American Test Symposium (LATS);2021-10-27
4. Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09
5. Evaluation of a COTS 65-nm SRAM Under 15 MeV Protons and 14 MeV Neutrons at Low VDD;IEEE Transactions on Nuclear Science;2020-10
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