A Method to Neutralize the Impact of DVS on the Reliability of COTS SRAMs With ECC by Using Periodic Scrubbing-Reference-Cited by-同舟云学术

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A Method to Neutralize the Impact of DVS on the Reliability of COTS SRAMs With ECC by Using Periodic Scrubbing

Published:2023-12 Issue:12 Volume:70 Page:2578-2589
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Rezaei Mohammadreza¹^ORCID,Franco Francisco J.²^ORCID,Hubert Guillaume³^ORCID,Clemente Juan A.¹^ORCID

Affiliation:

1. Computer Architecture Department, Facultad de Informática, Universidad Complutense de Madrid (UCM), Madrid, Spain

2. Department of Structure of Matter, Thermal Physics, and Electronics, Facultad de Ciencias Físicas, Universidad Complutense de Madrid (UCM), Madrid, Spain

3. ONERA French Aerospace Laboratory, Toulouse, France

Funder

Spanish Ministerio de Economía y Competitividad

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/10365556/10318142.pdf?arnumber=10318142

Reference49 articles.

1. Analysis of energy reduction on dynamic voltage scaling-enabled systems

2. Temperature-Aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold Computing

3. Statistical Write Stability Characterization in SRAM Cells at Low Supply Voltage

4. Ultra-low-voltage operation: Device perspective

5. COTS and the NewSpace

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