BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell

Author:

Holst Stefan1,Ma Ruijun2,Wen Xiaoqing1,Yan Aibin3,Xu Hui2

Affiliation:

1. Kyushu Institute of Technology,Iizuka,Japan,820-8502

2. Anhui University of Science and Technology,Huainan,China,232001

3. Anhui University,Hefei,China,230000

Publisher

IEEE

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Application;IEEE Transactions on Circuits and Systems I: Regular Papers;2024-06

2. An ultra low‐power double‐node‐upsets hardened latch design;International Journal of Circuit Theory and Applications;2024-03-24

3. Triple-node-upset self-recoverable latch design for aerospace applications;Microelectronics Reliability;2024-03

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