Author:
Holst Stefan,Ma Ruijun,Wen Xiaoqing
Cited by
3 articles.
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1. An ultra low‐power double‐node‐upsets hardened latch design;International Journal of Circuit Theory and Applications;2024-03-24
2. BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell;2023 IEEE European Test Symposium (ETS);2023-05-22
3. Evaluation and Test of Production Defects in Hardened Latches;IEICE Transactions on Information and Systems;2022-05-01