Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
25 articles.
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1. Automatic Test Pattern Generation;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
2. Test Generation for Short-Circuit Faults in Digital Circuits;Studies in Computational Intelligence;2014
3. Gate-level test generation for sequential circuits;ACM Transactions on Design Automation of Electronic Systems;1996-10
4. Universal test set generation for CMOS circuits;Journal of Electronic Testing;1995-06
5. Hierarchical test analysis of VLSI circuits for random BIST;Dependable Computing — EDCC-1;1994