Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference24 articles.
1. S.B. Akers, ?Functional Testing with Binary Decision Diagram?,Proc. Int. Symp. Fault-Tolerant Comput., pp. 82?92, June 1978.
2. M.A. Breuer and A.D. Friedman, ?Functional Level Primitives in Test Generation,?IEEE Trans. on Computers, Vol. C-29, No. 3, pp. 223?235, 1980.
3. Y.H. Levendel and P.R. Menon, ?Test Generation Algorithms for Computer Hardware Description Languages,?IEEE Trans. on Computers, Vol. C-31, No. 7, pp. 577?589, 1982.
4. M.S. Abadir and H.K. Reghbati, ?Functional Specification and Testing of Logic Circuits,?Comp. & Maths. with Appls., Vol. 11, No. 12, pp. 1143?1153, 1985.
5. M.S. Abadir and H.K. Reghbati, ?Functional Test Generation for LSI Circuits Described by Binary Decision Diagrams,?Proc. Int. Test. Conf., pp. 483?492, 1985.