Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints-Reference-Cited by-同舟云学术

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Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints

Published:2011-11 Issue: Volume: Page:
ISSN:
Container-title:2011 Asian Test Symposium
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Author:

Zadegan Farrokh Ghani,Ingelsson Urban,Asani Golnaz,Carlsson Gunnar,Larsson Erik

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6114262/6114277/06114729.pdf?arnumber=6114729

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Multi-Objective Evolutionary Approach for Test Network Design;2024 IEEE European Test Symposium (ETS);2024-05-20

2. RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

3. Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips;2023 IEEE European Test Symposium (ETS);2023-05-22

4. Power-aware test scheduling framework for IEEE 1687 multi-power domain networks using formal techniques;Microelectronics Reliability;2022-07

5. Improving IJTAG Test Efficiency and Security;2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT);2022-04-18

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