Improving IJTAG Test Efficiency and Security-Reference-Cited by-同舟云学术

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Improving IJTAG Test Efficiency and Security

Published:2022-04-18 Issue: Volume: Page:
ISSN:
Container-title:2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
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Author:

Wang Sying-Jyan¹,Shih Yen-Chang¹,Li Katherine Shu-Min²,Lin Chen-Yeh³,Chong Song-Kong³

Affiliation:

1. National Chung Hsing University,Dept. Computer Science Engineering,Taichung,Taiwan

2. National Sun Yat-sen University,Dept. Computer Science Engineering,Kaohsiung,Taiwan

3. Cybersecurity Technology Institute, Institute for Information Industry,Taipei,Taiwan

Funder

Ministry of Science and Technology of Taiwan

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9768045/9768046/09768048.pdf?arnumber=9768048

Reference14 articles.

1. Optimization of the IEEE 1687 access network for hybrid access schedules

2. On the testability of IEEE 1687 networks

3. Test Time Minimization in Reconfigurable Scan Networks

4. Increasing IJTAG bandwidth and managing security through parallel locking-SIBs

5. Securing IJTAG against data-integrity attacks

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