On the testability of IEEE 1687 networks-Reference-Cited by-同舟云学术

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On the testability of IEEE 1687 networks

Published:2015-11 Issue: Volume: Page:
ISSN:
Container-title:2015 IEEE 24th Asian Test Symposium (ATS)
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Author:

Cantoro R.,Montazeri M.,Reorda M. Sonza,Zadegan F. Ghani,Larsson E.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7421875/7422217/07447934.pdf?arnumber=7447934

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Complete Design-for-Test Scheme for Reconfigurable Scan Networks;Journal of Electronic Testing;2022-12

2. Improving IJTAG Test Efficiency and Security;2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT);2022-04-18

3. An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests;Journal of Circuits, Systems and Computers;2019-12-01

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