Power-aware test scheduling framework for IEEE 1687 multi-power domain networks using formal techniques-Reference-Cited by-同舟云学术

Power-aware test scheduling framework for IEEE 1687 multi-power domain networks using formal techniques

Published:2022-07 Issue: Volume:134 Page:114551
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Habiby Payam^ORCID,Huhn Sebastian^ORCID,Drechsler Rolf^ORCID

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference32 articles.

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5. Greedy tree growing heuristics on block-test scheduling under power constraints;Mureşan;J. Electron. Test.,2004

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