Access Time Analysis for IEEE P1687

Author:

Zadegan Farrokh Ghani,Ingelsson Urban,Carlsson Gunnar,Larsson Erik

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Multi-Objective Evolutionary Approach for Test Network Design;2024 IEEE European Test Symposium (ETS);2024-05-20

2. Embedded Tutorial: Access to On-chip Instruments via Functional Ports;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09

3. RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

4. Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips;2023 IEEE European Test Symposium (ETS);2023-05-22

5. Co-optimization of security and accessibility to on-chip instruments;2023 IEEE 24th Latin American Test Symposium (LATS);2023-03-21

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