Multilayer Perceptron-Based Stress Evolution Analysis Under DC Current Stressing for Multisegment Wires-Reference-Cited by-同舟云学术

Multilayer Perceptron-Based Stress Evolution Analysis Under DC Current Stressing for Multisegment Wires

Published:2023-02 Issue:2 Volume:42 Page:544-557
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Hou Tianshu¹^ORCID,Zhen Peining¹^ORCID,Wong Ngai²^ORCID,Chen Quan³^ORCID,Shi Guoyong¹^ORCID,Wang Shuqi¹^ORCID,Chen Hai-Bao¹^ORCID

Affiliation:

1. Department of Micro/Nano Electronics, Shanghai Jiao Tong University, Shanghai, China

2. Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong

3. School of Microelectronics, Southern University of Science and Technology, Shenzhen, China

Funder

National Key Research and Development Program of China

Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

Reference37 articles.

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4. HierPINN-EM;Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design;2022-10-30