Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
3 articles.
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1. Evaluating the Impact of Aging on Path-Delay Self-Test Libraries;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
2. A Review of Cell-Aware Test Patterns to Reduce the DPPM and Test Results from 7 nm;Journal of The Institution of Engineers (India): Series C;2023-04-05
3. Wrapping Paths of Undetected Transition Faults With Two-Cycle Gate-Exhaustive Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12