A Review of Cell-Aware Test Patterns to Reduce the DPPM and Test Results from 7 nm
Author:
Publisher
Springer Science and Business Media LLC
Subject
Industrial and Manufacturing Engineering,Mechanical Engineering,Ocean Engineering,Aerospace Engineering
Link
https://link.springer.com/content/pdf/10.1007/s40032-023-00935-y.pdf
Reference50 articles.
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5. A. Ben Ahmed, O. Mosbahi, M. Khalgui, Z. Li, Toward a new methodology for an efficient test of reconfigurable hardware systems. IEEE Trans. Autom. Sci Eng. 15(4), 1864–1882 (2018)
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