Author:
Mehta V.J.,Marek-Sadowska M.,Kun-Han Tsai ,Rajski J.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
21 articles.
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1. A Review of Cell-Aware Test Patterns to Reduce the DPPM and Test Results from 7 nm;Journal of The Institution of Engineers (India): Series C;2023-04-05
2. A Technical Survey on Delay Defects in Nanoscale Digital VLSI Circuits;Applied Sciences;2022-09-10
3. Logic Fault Diagnosis of Hidden Delay Defects;2020 IEEE International Test Conference (ITC);2020-11-01
4. New Targets for Diagnostic Test Generation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
5. Identifying Biases of a Defect Diagnosis Procedure;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2017-07