Transition Fault Simulation-Reference-Cited by-同舟云学术

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Transition Fault Simulation

Published:1987 Issue:2 Volume:4 Page:32-38
ISSN:0740-7475
Container-title:IEEE Design & Test of Computers
language:
Short-container-title:IEEE Des. Test. Comput.

Author:

Waicukauski John,Lindbloom Eric,Rosen Barry,Iyengar Vijay

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/54/4069948/04069962.pdf?arnumber=4069962

Cited by 127 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Generation of Two-Cycle Tests for Structurally Similar Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-02

2. An Evaluation of Estimated Field Random Testability for Data Paths at Register Transfer Level Using Status Signal Sequences Based on k-Consecutive State Transitions for Field Testing;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

3. Performance Screening Using Functional Path Ring Oscillators;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-06

4. A Review of Cell-Aware Test Patterns to Reduce the DPPM and Test Results from 7 nm;Journal of The Institution of Engineers (India): Series C;2023-04-05

5. Early Detection of Clustered Trojan Attacks on Integrated Circuits Using Transition Delay Fault Model;Cryptography;2023-01-28

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