Nonuniform Mechanism for Positive and Negative Bias Stress Instability in β-Ga<sub>2</sub>O<sub>3</sub> MOSFET-Reference-Cited by-同舟云学术

Nonuniform Mechanism for Positive and Negative Bias Stress Instability in β-Ga₂O₃ MOSFET

Published:2022-10 Issue:10 Volume:69 Page:5509-5515
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Jiang Zhuolin¹^ORCID,Wei Jie¹^ORCID,Lv Yuanjie²^ORCID,Wei Yuxi¹^ORCID,Wang Yuangang²^ORCID,Lu Juan¹,Liu Hongyu²^ORCID,Feng Zhihong²^ORCID,Zhou Hong³^ORCID,Zhang Jincheng³^ORCID,Xu Guangwei⁴^ORCID,Long Shibing⁴^ORCID,Luo Xiaorong¹^ORCID

Affiliation:

1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China

2. National Key Laboratory of Application Specific Integrated Circuit, Hebei Semiconductor Research Institute, Shijiazhuang, China

3. Key Laboratory of Wide Band Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi’an, China

4. School of Microelectronics, University of Science and Technology of China, Hefei, China

Funder

Key Laboratory Fund Project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/9901396/09882012.pdf?arnumber=9882012

Reference35 articles.

1. Mechanisms Underlying the Bidirectional V T Shift After Negative-Bias Temperature Instability Stress in Carbon-Doped Fully Recessed AlGaN/GaN MIS-HEMTs

2. Dependence of ${V}_{\text {TH}}$ Stability on Gate-Bias Under Reverse-Bias Stress in E-mode GaN MIS-FET

3. Interface trapping in (2¯01) β-Ga2O3 MOS capacitors with deposited dielectrics

4. Deep level defects throughout the bandgap of (010) β-Ga2O3detected by optically and thermally stimulated defect spectroscopy

5. Toward Understanding Positive Bias Temperature Instability in Fully Recessed-Gate GaN MISFETs

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