A 28nm 360ps-access-time two-port SRAM with a time-sharing scheme to circumvent read disturbs
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/6171933/6176863/06176991.pdf?arnumber=6176991
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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2. Compiler compatible 5.66 Mb/mm2 8T 1R1W register file in 14 nm FinFET technology;Integration;2020-01
3. A 28-nm 1R1W Two-Port 8T SRAM Macro With Screening Circuitry Against Read Disturbance and Wordline Coupling Noise Failures;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2018-11
4. Design of BiCMOS SRAMs for high‐speed SiGe applications;IET Circuits, Devices & Systems;2014-11
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