Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology-Reference-Cited by-同舟云学术

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Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology

Published:2016-02 Issue:1 Volume:63 Page:385-391
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Wang H.-B.,Mahatme N.,Chen L.,Newton M.,Li Y.-Q.,Liu R.,Chen M.,Bhuva B. L.,Lilja K.,Wen S.-J.,Wong R.,Fung R.,Baeg S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/7407456/7407517.pdf?arnumber=7407517

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5. Single-Event Transient (SET) sensitivity into the Clock Networks of FPGAs;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09

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