Heterogeneous Integration for Chiplets on FOWLP Development Line

Author:

Chong Chai Tai1,Ho Soon Wee1,Choong Chong Ser1,S Sharon Lim P1,Bhattacharya Surya1

Affiliation:

1. A*STAR (Agency for Science, Technology and Research),Institute of Microelectronics,Singapore,138634

Publisher

IEEE

Reference13 articles.

1. FOWLP Design for Digital and RF Circuits;guan;69th Electronic Components and Technology Conference (ECTC),2019

2. Fine Pitch Line/Space Lithography for Large Area Package with Multi-Field Stitching

3. Heterogeneous Integration with Embedded Fine Interconnect

4. Fan-Out Wafer Level Packaging Development Line;tc;Proc 23th Electron Packag Technol Conf,2021

5. High Density Interconnection for Heterogeneous Integration on FOWLP Platform

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1. Assembly process characterization of 3D Stacking of Heterogeneous Chiplets;2023 IEEE 25th Electronics Packaging Technology Conference (EPTC);2023-12-05

2. A Review of System-in-Package Technologies: Application and Reliability of Advanced Packaging;Micromachines;2023-05-29

3. Board level FEA reliability and stress modeling for chip-to-wafer bonded chiplet package;2023 IEEE 73rd Electronic Components and Technology Conference (ECTC);2023-05

4. Assembly Challenges and Approaches for 2.5D Chiplet Based System;2023 IEEE 73rd Electronic Components and Technology Conference (ECTC);2023-05

5. 3D Stacking of Heterogeneous Chiplets on Modified FOWLP Platform with Thru-Silicon Redistribution Layer;2023 IEEE 73rd Electronic Components and Technology Conference (ECTC);2023-05

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