Comprehensive Study on Advanced Chip on Wafer Hybrid Bonding with Copper/Polyimide Systems

Author:

Shirasaka Toshiaki1,Okuda Tadashi1,Shibata Tomoaki1,Yoneda Satoshi2,Matsukawa Daisaku2,Mariappan Murugesan3,Koyanagi Mitsumasa4,Fukushima Takafumi5

Affiliation:

1. Showa Denko Materials Co., Ltd.,Packaging Solution Center,Kawasaki,Japan

2. HD MicroSystems, Ltd.,Technology Development Center,Hitachi,Japan

3. Tohoku University,Global INTegration Initiative (GINTI), New Industry Creation Hatchery Center (NICHe),Sendai,Japan

4. NICHe Tohoku University,GINTI,Sendai,Japan

5. NICHe Tohoku University,Graduate School of Engineering/Graduate School of Biomedical Engineering /GINTI,Sendai,Japan

Publisher

IEEE

Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Thermodynamic modeling framework with experimental investigation of the large-scale bonded area and local void in Cu-Cu bonding interface for advanced semiconductor packaging;International Journal of Plasticity;2024-09

2. Chemical mechanical planarization of nanotwinned copper/polyimide for low temperature hybrid bonding;Journal of Electroanalytical Chemistry;2024-09

3. Experimental and Numerical Investigation of Cu-Cu Direct Bonding Quality for 3D Integration;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

4. Low-Temperature Polymer Hybrid Bonding with Nanoparticulated Cu and Photosensitive Acrylic Adhesive;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

5. Advanced Chip on Wafer Hybrid Bonding with Copper/Polymer Base Adhesive;2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA);2024-04-22

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