1. Test and Repair Improvements for UCIe;2024 IEEE European Test Symposium (ETS);2024-05-20
2. Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency;2023 IEEE International Test Conference in Asia (ITC-Asia);2023-09-12
3. Effective and Efficient Testing of Large Numbers of Inter-Die Interconnects in Chiplet-Based Multi-Die Packages;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
4. Design-for-Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
5. NoC Verification and Testing;Designing 2D and 3D Network-on-Chip Architectures;2013-10-09