1. Timing, Test and Manufacturing Overview;The Best of ICCAD;2003
2. TILOS: A Posynomial Programming Approach to Transistor Sizing;The Best of ICCAD;2003
3. Digital CMOS Fault Modeling and Inductive Fault Analysis;Defect Oriented Testing for CMOS Analog and Digital Circuits;1999
4. History and Background: Digital Logic and Fault Simulation;Concurrent and Comparative Discrete Event Simulation;1994
5. Digital CMOS Fault Modeling;Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits