Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM-Reference-Cited by-同舟云学术

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

Published:2009-12 Issue:6 Volume:56 Page:3499-3504
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Heidel David F.,Marshall Paul W.,Pellish Jonathan A.,Rodbell Kenneth P.,LaBel Kenneth A.,Schwank James R.,Rauch Stewart E.,Hakey Mark C.,Berg Melanie D.,Castaneda Carlos M.,Dodd Paul E.,Friendlich Mark R.,Phan Anthony D.,Seidleck Christina M.,Shaneyfelt Marty R.,Xapsos Michael A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/5341340/05341353.pdf?arnumber=5341353

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