Methods for Proton Direct Ionization SEU Characterization and Orbital Error-Rate Estimation-Reference-Cited by-同舟云学术

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Methods for Proton Direct Ionization SEU Characterization and Orbital Error-Rate Estimation

Published:2024-08 Issue:8 Volume:71 Page:1707-1714
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Glorieux Maximilien¹^ORCID,Bonnoit Thierry¹^ORCID,Lange Thomas¹,Gaillard Remi¹,Nofal Issam¹^ORCID,Artola Laurent²^ORCID,Poivey Christian³^ORCID,Levacq David³^ORCID,Rey Romain²,Heikki Kettunen⁴,Polo Cesar Boatella³

Affiliation:

1. IROC Technologies, Grenoble, France

2. ONERA/DPHY, Université de Toulouse, Toulouse, France

3. European Space Agency, ESTEC, Noordwijk, AG, The Netherlands

4. Department of Physics, Accelerator Laboratory, University of Jyväskylä, Jyväskylä, Finland

Funder

European Space Agency

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/23/10638256/10521878.pdf?arnumber=10521878

Reference27 articles.

1. Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

2. Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

3. Heavy Ion, High-Energy, and Low-Energy Proton SEE Sensitivity of 90-nm RHBD SRAMs

4. Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam

5. The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

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