Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

Published:2007-12 Issue:6 Volume:54 Page:2474-2479
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Rodbell Kenneth P.,Heidel David F.,Tang Henry H. K.,Gordon Michael S.,Oldiges Phil,Murray Conal E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/4394990/04395078.pdf?arnumber=4395078

Cited by 137 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Assessment of the Quirónsalud Proton Therapy Centre Accelerator for Single Event Effects Testing;IEEE Transactions on Nuclear Science;2024-08

2. Methods for Proton Direct Ionization SEU Characterization and Orbital Error-Rate Estimation;IEEE Transactions on Nuclear Science;2024-08

3. The Deep Space Radiation Probe: Development of a first lunar science payload for space environment studies and capacity building;Advances in Space Research;2024-05

4. Investigation of the Impact of Angles and Rotation of Low-Energy Protons in SRAM Cells Down to 16 nm;IEEE Transactions on Nuclear Science;2024-04

5. Proton- and Neutron-Induced SEU Cross-Section Modeling and Simulation: A Unified Analytical Approach;Radiation;2024-02-14

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP