Author:
Ye Bing,Cai Li,Luo Jie,Zhai Pengfei,Juan Yang,Wu Zhaoxi,Gao Shuai,Yan Xiaoyu,Sun Youmei,Liu Jie
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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1. Characteristics of secondary ions and their impact on single-event upset in TMD devices under proton irradiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-02