RF reliability of short channel NMOS devices-Reference-Cited by-同舟云学术

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RF reliability of short channel NMOS devices

Published:2009-06 Issue: Volume: Page:
ISSN:
Container-title:2009 IEEE Radio Frequency Integrated Circuits Symposium
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Author:

Stephens D.,Vanhoucke T.,Donkers J. J. T. M.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5076160/5135437/05135554.pdf?arnumber=5135554

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