1. 1."RF BIASED LIFE (RFBL) TEST METHOD", JESD226, JEDEC Solid State Technology Association, 2013.
2. 2."Guideline for GaAs MMIC and FET Life Testing", JEP118, Electronic Industries Association, 1993.
3. 3."Reliability Qualification of Power Amplifier Modules", JESD237, JEDEC Solid State Technology Association, 2014.
4. 4.J. Joh, and J. A. del Alamo, "RF power degradation of GaN High Electron Mobility Transistors", 2010 International Electron Devices Meeting, San Francisco, CA, USA, pp. 20.2.1-20.2.4, 2010.
5. 5.W. J. Roesch, "Developing Power Amplifier Module Standards for Reliability Qualification", CS MANTECH Conference, pp. 301-304, 2014.