Author:
Itoh K.,Hori R.,Masuda H.,Kamigaki Y.,Kawamoto H.,Katto H.
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Assessing Dynamic RAM Technology with Contrast Era of Megabit, Gigabit, and Merged Dynamic RAM/Logic;Lecture Notes in Electrical Engineering;2023
2. Background and Related Work;Reliable Software for Unreliable Hardware;2016
3. Access time analysis of dynamic MOS RAM;Electronics and Communications in Japan (Part I: Communications);1983
4. Analysis of soft error in MOS dynamic RAM;Electronics and Communications in Japan (Part I: Communications);1982
5. Memory Leakage Reduction;Leakage in Nanometer CMOS Technologies