Funder
State Key Laboratory of Computer Architecture (ICT, CAS), China
Basic and Applied Basic Research Foundation of Guangdong Province
National Key Research and Development Program of China
National Natural Science Foundation of China
Major Research Plan of the National Natural Science Foundation of China
Guangdong Natural Science Foundation
Guangdong Key Research and Development Project of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
22 articles.
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1. A synergistic fault tolerance framework for Mbit 28nm embedded RRAM;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
2. Fault Diagnosis for Resistive Random Access Memory and Monolithic Inter-Tier Vias in Monolithic 3-D Integration;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-07
3. A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing;Journal of Electronic Testing;2024-03-23
4. Memristors: Device Modeling, Design and Verification;2023 IEEE International Symposium on Smart Electronic Systems (iSES);2023-12-18
5. An Analysis of Fault Diagnosis Approaches in Memristor Crossbar Array;2023 IEEE International Symposium on Smart Electronic Systems (iSES);2023-12-18