Author:
Girard P.,Landrault C.,Pravossoudovitch S.
Cited by
25 articles.
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1. Machine Learning Support for Logic Diagnosis and Defect Classification;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22
2. Defect Diagnosis via Segment Delay Learning;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2016-01
3. Diagnosis Methods for Gate Delay Faults with Various Amounts of Delays;IPSJ Transactions on System LSI Design Methodology;2016
4. Delay Defect Diagnosis Methodology Using Path Delay Measurements;IEICE Transactions on Electronics;2015
5. Selection of a Fault Model for Fault Diagnosis Based on Unique Responses;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2010-11