Defect Diagnosis via Segment Delay Learning
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Published:2016-01
Issue:1
Volume:24
Page:388-392
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ISSN:1063-8210
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Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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language:
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Short-container-title:IEEE Trans. VLSI Syst.
Author:
Chung Jaeyong,Kang Woochul
Funder
Incheon National University, Incheon, Korea, under the (New Faculty) Research Grant in 2014
IDEC, Daejeon, Korea
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software