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S-Parameter De-Embedding Error Estimation Based on the Statistical Circuit Models of Fixtures

  • Published:2020-08 Issue:4 Volume:62 Page:1459-1467
  • ISSN:0018-9375
  • Container-title:IEEE Transactions on Electromagnetic Compatibility
  • language:
  • Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Liu YuanzhuoORCID,Yong ShaohuiORCID,Gao Han,Hinaga ScottORCID,Padilla Darja,Yanagawa DouglasORCID,Drewniak James L.ORCID,Khilkevich VictorORCID

Funder

National Science Foundation

IEEE Symposium on Electromagnetic Compatibility

Signal and Power Integrity

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Determining the Permittivity of a PCB Dielectric Using Striplines Considering Copper Roughness;IEEE Microwave and Wireless Technology Letters;2024

3. Surface Roughness Effect From Different Surfaces of Microstrip Lines and Reference Plane;IEEE Letters on Electromagnetic Compatibility Practice and Applications;2023-09

4. 2x-Thru De-embedding Uncertainty for On-Package High-Speed Interconnects;2022 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS);2022-12-12

5. Dielectric Loss Tangent Extraction Using Two Single-ended Striplines of Different Width;2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI);2022-08-01
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