Dielectric Loss Tangent Extraction Using Two Single-ended Striplines of Different Width-Reference-Cited by-同舟云学术

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Dielectric Loss Tangent Extraction Using Two Single-ended Striplines of Different Width

Published:2022-08-01 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
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Author:

Li Jiangshuai¹,Liu Yuanzhuo¹,Liu Liang¹,Xia Shengxuan¹,Hinaga Scott²,Khilkevich Victor¹

Affiliation:

1. Missouri University of Science and Technology,EMC Laboratory,Rolla,MO,USA

2. Cisco Systems, Inc,San Jose,CA,USA,95134

Funder

National Science Foundation (NSF)

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9889328/9889311/09889568.pdf?arnumber=9889568

Reference13 articles.

1. S-Parameter De-Embedding Error Estimation Based on the Statistical Circuit Models of Fixtures

2. A Practical De-embedding Error Analysis Method Based on Statistical Circuit Models of Fixtures

3. A novel de-embedding method suitable for transmission-line measurement

4. De-embedding method to accurately measure high-frequency impedance of an O-shape spring contact

5. Application of the TE01 mode dielectric resonator for the complex permittivity measurements of semiconductors;krupka;Proceedings of CPEM '86,1986

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Extraction of Transmission Line Surface Roughness Using S-Parameter Measurements and Cross-Sectional Information;IEEE Transactions on Signal and Power Integrity;2024

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