Validation of IC Conducted Emission and Immunity Models Including Aging and Thermal Stress
Author:
Affiliation:
1. Department of Electrical and Electronic Engineering, ESEO School of Engineering, Angers, France
2. Microchip, Nantes, France
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Link
http://xplorestaging.ieee.org/ielx7/15/10149542/10074991.pdf?arnumber=10074991
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4. A Nonlinear Microcontroller Power Distribution Network Model for the Characterization of Immunity to Electrical Fast Transients
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