High Temperature Accelerated Ageing Influence on the Conducted Immunity Modelling of the Commonly Used Voltage Regulator ICs-Reference-Cited by-同舟云学术

High Temperature Accelerated Ageing Influence on the Conducted Immunity Modelling of the Commonly Used Voltage Regulator ICs

Published:2023-09-04 Issue: Volume: Page:
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Container-title:2023 International Symposium on Electromagnetic Compatibility – EMC Europe
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Author:

Al Rashid Jaber¹,Koohestani Mohsen²,Saintis Laurent³,Barreau Mihaela³

Affiliation:

1. University of Angers ESEO School of Engineering,LARIS, SFR MATHSTIC,Angers,France,F–49000

2. University of Rennes 1 ESEO School of Engineering,IETR,Angers,France,49017

3. University of Angers,LARIS, SFR MATHSTIC,Angers,France,F–49000

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10274151/10274152/10274315.pdf?arnumber=10274315

Reference19 articles.

1. Multi-port ICIM-CI modeling approach applied to a bandgap voltage reference;airieau;Proc Int Symp Electromagn Compat EMC,2016

2. Validation of IC Conducted Emission and Immunity Models Including Aging and Thermal Stress

3. Investigation on EFT effects in a low dropout voltage regulator

4. LDO EMC susceptibility modeling with on-chip sensor measurements

5. IEC 62433-4: integrated circuit–EMC IC modeling–Part 4: Models of Integrated Circuits for EMI behavioral simulation, Conducted Immunity Modeling (ICIM-CI);IEC standard proposal,2008

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