Lifetime reliability modeling on EMC performance of digital ICs influenced by the environmental and aging constraints: A case study

Author:

Al Rashid JaberORCID,Koohestani Mohsen,Saintis Laurent,Barreau Mihaela

Funder

Universite Angers

Région Pays de la Loire

Publisher

Elsevier BV

Reference32 articles.

1. Improved immunity measurement of a microcontroller to conducted continuous wave interference;Wan;Prog. Electromagn. Res. M,2013

2. Direct power injection on functional and non-functional signals of SPI EEPROM memories;Amellall,2015

3. Origins of electromagnetic immunity holes of microcontrollers;Su,2010

4. Predicting the immunity of integrated circuits through measurement methods and simulation models;Alaeldine,2007

5. Microcontroller susceptibility variations to EFT burst during accelerated aging;Wu;Microelectron. Reliab.,2016

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