Conduction Immunity Modeling Approach for Nonlinear IB Module Based on Multi-Harmonic Distortion Theory in Analog-Digital Integrated Circuit (MADIC)
Author:
Affiliation:
1. School of Electronic and Information Engineering, Beihang University
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Link
https://www.jstage.jst.go.jp/article/elex/advpub/0/advpub_21.20240324/_pdf
Reference30 articles.
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2. [2] J. Loeckx and G. Gielen: “Assessment of the DPI standard for immunity simulation of integrated circuits,” IEEE International Symposium on Electromagnetic Compatibility (2007) 1 (DOI: 10.1109/ISEMC.2007.160).
3. [3] Integrated circuits-Measurement of electromagnetic immunity, 150 kHz to 1 GHz- Part 4 : Direct RF power injection method, in: IEC 62132-4, Ed1 (2006).
4. [4] S. Graffi, et al.: “New macromodels and measurements for the analysis of EMI effects in 741 op-amp circuits,” IEEE Trans. Electromagn. C. 33 (1991) 25 (DOI: 10.1109/15.68258).
5. [5] S. R. Rao, et al.: “Black-Box Behavioral DC-DC Converter IC Emission Model,” 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (2022) (DOI: 10.1109/EMCSI39492.2022.9889598).
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